Electronic thermometer with flex circuit location

ABSTRACT

An electronic thermometer is configured for ease and accuracy in construction. A probe of the thermometer includes a flex circuit containing electronic components used to measure temperature and transmit signals to a calculating unit of the thermometer. A locating member supported by the probe can function to pre-position the flex circuit prior to final fixation so that the electronic components are reliably positioned in manufacture.

BACKGROUND OF THE INVENTION

The invention pertains to the field of electronic thermometers and moreparticularly the field of fast response electronic thermometersemploying a sensor probe.

Electronic thermometers are widely used in the healthcare field formeasuring a patient's body temperature. Typical electronic thermometershave the form of a probe with an elongated shaft. Electronic temperaturesensors such as thermistors or other temperature sensitive elements arecontained within the shaft portion. In one version, the probe includes acup-shaped aluminum tip at its free end. A thermistor is placed inthermal contact with the aluminum tip inside the probe. When a free endportion is placed, for example, in a patient's mouth, the tip is heatedup by the patient's body and the thermistor measures the temperature ofthe tip. Additional electronics connected to the electronic sensorcomponents may be contained within a base unit connected by wire to theshaft portion or may be contained within a handle of the shaft portion,for example. Electronic components receive input from the sensorcomponents to compute the patient's temperature. The temperature is thentypically displayed on a visual output device such as a seven segmentnumerical display device. Additional features of known electronicthermometers include an audible temperature level notification such as abeep or tone alert signal. A disposable cover or sheath is typicallyfitted over the shaft portion and disposed after each use of thethermometer for sanitary reasons.

Electronic thermometers have many advantages over conventionalthermometers and have essentially replaced the use of conventional glassthermometers in the healthcare field. One advantage of electronicthermometers over their conventional glass counterparts is the speed atwhich a temperature reading can be taken. Several procedures are used topromote a rapid measurement of the subject's temperature. One techniqueemployed is to use predictive algorithms as part of thermometer logic toextrapolate the temperature measurements from the thermistor in contactwith the tip to arrive at a temperature reading in advance of the tipreaching equilibrium with the body temperature. Another technique thatcan be employed simultaneously with a predictive algorithm is to heatthe probe to near the body temperature so that part of the probe awayfrom the tip does not act as a heat sink, allowing the tip to reach atemperature close to the body temperature more rapidly. Heating can beaccomplished by a resistor placed in contact with the probe. Anotherthermistor may be placed in contact with the probe to measure the amountthe resistor is heating the probe, which is used to control the heating.It is also known to use an isolator to reduce heat loss from the tip toother parts of the probe. Co-assigned U.S. Pat. No. 6,839,651 disclosesthe use of such an isolator and is incorporated herein by reference.

To assemble the probe, the circuitry (e.g., the thermistors andresistor) is mounted on a flexible substrate that supports and provideselectrical connection for the components. The combination of thecomponents and the flexible substrate is commonly called a “flexcircuit”. The substrate may be initially flat to facilitate ease ofmounting the components, but can be bent into position upon assemblyinto the probe. More specifically, the flexible substrate is bent toplace one thermistor in position for contacting the probe tip, and toplace the resistor and other thermistor in contact with a separatoradjacent the probe tip. These components can be glued in place with athermally conductive adhesive in the final assembly. However, before theadhesive is brought into contact with the components and/or before theadhesive sets, the components may undesirably move. The result of motioncan be insufficient contact of the components with the tip and/orseparator to heat or sense temperature in the final assembly.Preferably, such assembly failures should be minimized or avoided, and ahighly repeatable assembly process is achieved.

SUMMARY OF THE INVENTION

In one aspect of the present invention, an electronic thermometergenerally comprises a probe tip adapted to be heated to a temperature byan object forth use in measuring the temperature of the object. Adeformable circuit element includes a deformable electrical conductorand at least one temperature sensor connected to the electricalconductor for detecting the temperature of the probe tip. A probe shaftsupports the probe tip and deformable circuit element and includes anend portion. A separator is supported by the probe shaft. A locatingmember supported by the probe shaft is formed for at least temporarilylocating the deformable circuit element.

In another aspect of the present invention, a probe having substantiallythe same construction as set for in the preceding paragraph.

In yet another aspect of the present invention, a method of making aprobe for an electronic thermometer generally comprises positioning adeformable circuit element together with a probe shaft and deforming thedeformable circuit element. A locating member is connected to the probeshaft. The deformable circuit element and locating member areinterconnected for use in locating the deformable circuit element.

Other features of the present invention will be in part apparent and inpart pointed out hereinafter.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 is a perspective of an electronic thermometer;

FIG. 2 is a perspective of a probe of the electronic thermometer;

FIG. 3 is a fragmentary perspective of the probe with parts broken awayto show internal construction;

FIG. 3A is an enlarged, fragmentary section of the probe;

FIG. 4 is an exploded perspective of a flex circuit, separator andisolator of the probe;

FIG. 5 is a perspective of the flex circuit received in the separatorduring assembly;

FIG. 6 is a perspective of the separator and the flex circuit deformedto receive the isolator;

FIG. 7 is a perspective of the assembled flex circuit, separator andisolator with a tip of the probe being placed over the isolator;

FIG. 8 is an enlarged perspective of the isolator;

FIG. 9 is a top side perspective of another version of an isolator for aprobe of a second embodiment;

FIG. 10 is a bottom side perspective of the isolator of FIG. 9;

FIG. 11 is an elevation of a flex circuit of the probe of the secondembodiment;

FIG. 12 is a fragmentary section of a free end of the probe of thesecond embodiment showing a flex circuit inserted into a separator andprobe shaft;

FIG. 13 is a fragmentary section of a free end of the fully assembledprobe of the second embodiment;

FIG. 14 is a top side perspective of an isolator of a probe of a thirdembodiment;

FIG. 15 is a bottom side perspective of the isolator of FIG. 14; and

FIG. 16 is a fragmentary section similar to FIG. 13, but showing theprobe of a third embodiment.

Corresponding reference characters indicate corresponding partsthroughout the several views of the drawings.

DETAILED DESCRIPTION

Referring now to the drawings and in particular to FIGS. 1 and 2, anelectronic thermometer constructed according to the principles of thepresent invention is indicated generally at 1. The electronicthermometer comprises a temperature calculating unit, indicatedgenerally at 3, that is sized and shaped to be held comfortably in thehand H. The calculating unit 3 (broadly, “a base unit”) is connected bya helical cord 5 to a probe 7 (the reference numerals indicating theirsubjects generally). The probe 7 is constructed for contacting theobject (e.g., a patient) and sending signals to the calculating unit 3representative of the temperature. The calculating unit 3 receives thesignals from the probe 7 and uses them to calculate the temperature.Suitable circuitry for performing these calculations is contained withina housing 9 of the calculating unit 3. The logic in the circuitry mayinclude a predictive algorithm for rapidly ascertaining the finaltemperature of the patient. The circuitry makes the calculatedtemperature appear on a LCD display 11 on the front of the housing 9.Other information desirably can appear on the display 11, as will beappreciated by those of ordinary skill in the art. A panel 11A ofbuttons for operating the thermometer 1 is located just above thedisplay 11.

The housing 9 includes a compartment (not shown) generally at the rearof the housing that can receive a distal portion of the probe 7 into thehousing for holding the probe and isolating the distal portion from theenvironment when not in use. FIG. 1 illustrates the probe 7 being pulledby the other hand H1 from the compartment in preparation for use. Thehousing 9 also has a receptacle 13 that receives a suitable containersuch as a carton C of probe covers (not shown). In use, the top of thecarton C is removed, exposing open ends of the probe covers. The distalportion of the probe 7 can be inserted into the open end of the carton Cand one of the probe covers can be captured (e.g., snapped into) anannular recess 14. Pushers 15 are located at the junction of a handle 17of the probe 7 with a probe shaft 19. The probe shaft is protected fromcontamination by the cover when the distal portion of the probe shaft 19is inserted, for example, into a patient's mouth. A button 21 on theprobe handle 17 can be depressed to cause the pushers 15 to move forreleasing the probe cover from the probe shaft 19. Subsequent to use,the probe cover can be discarded. Other ways of capturing and releasingprobe covers may be used without departing from the scope of the presentinvention.

An aluminum tip 25 at the distal end of the probe shaft 19 is heated upby the patient and the temperature of the tip is detected, as will bedescribed more fully hereinafter. The probe cover is preferably made ofhighly thermally conductive material, at least at the portion coveringthe tip 25, so that the tip can be rapidly heated by the patient.Referring now to FIGS. 3 and 3A, the tip 25 and distal end of the probeshaft 19 are partially broken away (or shown in section) to revealcomponents used to measure the temperature of the tip. A generallytubular separator, generally indicated at 27, is mounted on the distalend of the probe shaft 19 and extends generally into the open bottom ofthe tip 25, but does not engage the tip. An isolator indicated generallyat 29 is mounted on the end of the separator 27 and engages the tip 25for use in mounting the tip on the probe shaft 19. The probe shaft, tip25, separator 27 and isolator 29 (broadly, “a locating member”) may beconnected together in a suitable fashion. A flex circuit, generallyindicated at 31, includes a deformable substrate 33 mounting a tipthermistor 35, a separator thermistor 37 and a heating resistor 39 (see,FIG. 4). The tip thermistor 35 is in thermal contact with the tip 25,and the separator thermistor 37 and heating resistor 39 are in thermalcontact with the separator 27. It will be appreciated that otherelectrical components (not shown) and other arrangements and numbers ofcomponents may be used without departing from the scope of the presentinvention.

The tip thermistor 35, separator thermistor 37 and resistor 39 arepowered by batteries (not shown) located in the housing 9 of thethermometer 1. It will be understood that other suitable power sourcescould be employed. The power source need not be located in thecalculating unit housing 9 and it is envisioned that the calculatingunit 3 could be omitted within the scope of the present invention. Thetip thermistor 35 generates a signal that is representative of thetemperature of the tip 25. The signal is transmitted by one or moreelectrical conductors in the flex circuit substrate 33 to the circuitryin the housing 9. The separator thermistor 37 generates a signal that isrepresentative of the temperature of the separator 27. The resistor 39is powered by the batteries and heats the separator 27 so that thealuminum tip 25 can reach the temperature of the patient more rapidly.Monitoring the temperature of the separator 27 with the separatorthermistor 37 allows the heating of the resistor 39 to be controlled tobest effect. For instance, the separator 27 can be initially rapidlyheated, but then heated intermittently as the separator nears or reachesa pre-selected temperature. The function and operation of thesecomponents are known to those of ordinary skill in the art.

Referring now to FIG. 4, the flex circuit 31 (broadly, “a deformablecircuit element”), separator 27 and isolator 29 are schematicallyillustrated prior to assembly. The flex circuit substrate 33 has a flat,cruciform shape that unless deformed would not fit into the separator27. To assemble the flex circuit 31 and separator 27, arms 43 of theflex circuit substrate 33 are bent inwardly toward each other (in thedirections indicated by arrows in FIG. 4) so that the flex circuitsubstrate assumes a somewhat cylindrical configuration and the separatorthermistor 37 and resistor 39 are located on the outside of the flexcircuit substrate. The flex circuit 31 can be inserted through a largeropen end 45 of the separator 27 to a position in which the separatorthermistor 37 and resistor 39 are located in a neck 47 of the separator,and a head 49 of the flex circuit substrate 33 mounting the tipthermistor 35 projects out of a smaller open end (not shown) of theseparator (see FIG. 5). Preferably, the flex circuit substrate 33 isresilient so that the arms 43 tend to push outwardly against an interiorwall 51 of the separator 27 to bring portions of the outer surface ofthe substrate opposite the separator thermistor 37 and resistor 39 intocontact with the interior wall. A thermally conducting epoxy or othersuitable adhesive (not shown) is preferably applied to the contactingportions of the outer surface of the substrate 33 and/or to the interiorof the neck 47 of the separator 27 prior to insertion of the flexcircuit substrate 33 so that when the substrate portions make contactwith the interior wall 51 of the neck, they are held in place.

Referring to FIG. 6, the head 49 of the flex circuit substrate 33 isbent over in a generally inverted-U configuration and the isolator 29 ismoved onto the flex circuit 31 with the bent head being received in acentral opening 55 of the isolator. The isolator 29 has a nub 57(broadly, “locating structure”) located on an inner diameter surface 59of the isolator and projecting inwardly into the central opening 55 (seealso FIG. 8). Preferably, the isolator 29 is made of a material that isa poor thermal conductor to minimize thermal communication between thetip 25 and the separator 27. An aperture 63 in the head 49 of the flexcircuit substrate 33 is aligned with the nub 57. When a force holdingthe head 49 of the substrate 33 in the bent, inverted-U position isreleased, the head tries to move back toward its unbent configuration.The movement of the substrate 33 causes the aperture 59 to move over thenub 57, capturing the free end of the head 49 and preventing it frommoving further toward its undeformed configuration. A diametricallyopposite part of the head 49 engages a side of the interior diametersurface 59 of the isolator 29 generally opposite the nub 57. An adhesivemay be applied to further assist holding the head 49 on the nub 57. Theisolator 29 can be pushed down (e.g., press-fit) onto the separator 27.In this way, the isolator 29 can act to preliminarily locate the head 49of the substrate 33 and the tip thermistor 35 prior to final assembly.This accurate location of the flex circuit 31 is highly repeatable formanufacturing assembly of the probe 7.

The tip 25 can be secured to the subassembly of the flex circuit 31,separator 27 and isolator 29, as illustrated in FIG. 7. The resilienceof the flex circuit substrate 33 causes it to act as a spring in itsdeformed condition to bias the flex circuit head 49 and the tipthermistor 35 toward the tip 25 for good thermal contact of a portion ofthe head generally opposite to the tip thermistor with the tip. An epoxyor other adhesive may be applied on the separator 27 at the base of theneck 47. An epoxy can also be applied to either or both of the portionof the outer surface of the head 49 that will contact the tip 25, andthe interior of the tip. The tip 25 is pushed onto the separator 27 sothat the bent head 49 of the flex circuit substrate 33, the isolator 29and the neck 47 of the separator are received in the tip 25. The tipthermistor 35 is positioned by the isolator 29 so that the portion ofthe outer surface of the head directly opposite the tip thermistor willmake contact with the tip 25 substantially in its center. Preferably,the center of the tip 25 is substantially flat to further facilitategood contact for transfer of heat from the tip, through the substrate 33and to the tip thermistor 35. The epoxy can be cured to finally securethe tip 25 and portion of the flex circuit substrate head 49 carryingthe tip thermistor 35, as well as securing the portions of the flexcircuit arms 43 carrying the separator thermistor 37 and resistor 39 tothe separator 27. The bottom portion of the flex circuit substrate 33can be slid into the probe shaft 19 and electrical connections made atthe handle 17 of the probe 7 for connection to the cord 5 and hence thecircuitry in the housing 9. This assembly step may occur prior to thesteps of deforming the flex circuit substrate 33, and applying theseparator 27, isolator 29 and tip 25 that are described previouslyherein.

Referring now to FIGS. 9-12 a probe 107 of a second embodiment is shown.Parts of the probe 107 of the second embodiment corresponding to thoseof the probe 7 of the first embodiment will be given the same referencenumber, plus “100”. An isolator 129 of the probe 107 is shown tocomprise a disk 108 having a slot 110, and an annular skirt 112depending from the peripheral edge margin of the disk. A platform 114formed with the disk 108 is located above the top of the disk. Theplatform 114 has a pair of protrusions 116 (broadly, “locatingstructure”) that extend upward from a top surface 118 of the platform(FIG. 9). A resilient locator indicated generally at 120 depends fromthe disk 108 (FIG. 10). The resilient locator 120 has a generallytubular shape and defining a cavity 122 that extends through theresilient locator (FIG. 13). The locator 120 is resiliently deformable,as by deflecting to a more flattened configuration, for use in locatingelectrical components of the probe. Preferably, the isolator 129 is madeof a thermally insulating material that is also resilient for reasonsexplained more fully hereinafter.

The probe 107 includes a flex circuit 131 comprising a deformablesubstrate 133 including a pair of arms 143 and a head 149 (FIG. 11). Inits undeformed position, the arms 143 extend generally parallel to thehead 149 along opposite sides. The ends of the arms 143 are formed withenlarged stop tabs 144. The tabs define shoulders 146 at theirintersections with thinner parts of the arms 143. A separator thermistor137 and a resistor 139 are mounted on respective ones of the stop tabs144. The distal end of the head 149 is formed with notches 148 onopposite sides of the head. A tip thermistor 135 is attached to the flexcircuit substrate 133 between these notches 148. The flex circuit 131can be assembled with other components to form the probe 107.

Assembly of the probe 107 of the second embodiment may be carried out asfollows. A tubular separator 127 is attached to the distal end of aprobe shaft 119 in a suitable manner such as by applying epoxy 150 tothe upper end of the shaft and/or lower inside diameter of theseparator. In preparation for subsequent attachment steps, a thermallyconductive epoxy may be applied to the tip thermistor 135, separatorthermistor 137 and resistor 139. The epoxy may be applied at 152 tothese electrical components. It will be noted that the tip thermistor135, separator thermistor 137 and resistor 139 are located on the“outside” of the flex circuit substrate 133 in this embodiment so thatthey directly contact the tip 135 and separator 137 (respectively).However, the tip thermistor 135, separator thermistor 137 and resistor139 could be placed in a more conventional position on the inside of theflex circuit substrate 133 (i.e., so that the substrate directlycontacts the tip and separator rather than the electrical components).The flex circuit substrate 133 can then be pulled through the probeshaft 119 from its distal end until the shoulders 146 on the stop tabs144 of the arms 143 engage an annular distal end surface 154 of theshaft and resist further movement of the flex circuit relative to theshaft (FIG. 12). Instead of bending at right angles to their length likethe cruciform flex circuit substrate 33 of the first embodiment, thearms 143 of the flex circuit substrate 133 are twisted nearly parallelto their lengthwise extent so that they are oriented nearly orthogonallyto a plane including the head 149 when inserted into the probe shaft119. The stop tabs 144 are in generally opposed relation and theseparator thermistor 137 and resistor face 139 (and preferably engage) agenerally cylindrical interior wall 151 of the separator 127 within aneck 147 of the separator.

The isolator 129 is placed onto the neck 147 of the separator 127 withthe top portion of the neck received within the skirt 112 of theisolator (FIG. 13). The head 149 of the flex circuit substrate 133 isthreaded through the slot 110 so that it may extend above the isolator129. The resilient locator 120 of the isolator extends into the neck 147of the separator 127 and is deformed inwardly by engagement with thestop tabs 144 of the flex circuit substrate 133. The resilient locator120 pushes the stop tabs 144, and the separator thermistor 137 andresistor 139 mounted on them outward against the inner wall of theseparator. In this way the resilient locator 120 biases the thermistor137 and resistor 139 against the interior wall 151 of the separator 127for achieving good contact with the separator before the epoxy 152 isset.

The head 149 of the flex circuit substrate 133 is bent over in adirection transverse to the longitudinal axis of the probe shaft 119 andplaced on the platform 114. The head 149 is pushed down toward the topsurface 118 so that the notches 148 receive the protrusions 116. Theedges of the notches 148 frictionally engage the protrusions to grip andhold the head 149 in position. Thus, the tip thermistor 135 is locatedaccurately, lying substantially on the probe shaft axis. The isolator129 grips the head 149 so that it is held in place prior to finalassembly of the probe 107. An aluminum tip 125 is then attached to thissubassembly. Epoxy 158 is preferably applied to the outside of theseparator neck 147, and the tip 125 is pushed onto the end of theseparator 127 over the isolator 129. The previously applied epoxy 152 onthe tip thermistor 135 engages an interior central portion of the tip125. The entire assembled probe 107 can be placed in an oven for curingthe epoxy and achieving final fixation of the various components. Othersuitable ways of securing the components together may be employed withinthe scope of the present invention.

In a modified version of the probe of the second embodiment, the arms143′ of the flex circuit substrate 133 would be longer (see phantomillustration in FIG. 13) so that they extend through the isolator 129.The isolator would be formed with additional slots (not shown) toreceive the arms 143′ through it. The separator thermistor 137 andresistor 139 would still be in the same location against the sides ofthe separator 127. In this modified version, the isolator would furtheraid in holding the arms in position after they are deformed from theirundeformed position (e.g., as shown in FIG. 11). It will be appreciatedthat other ways of locating the electrical components of the flexcircuit in place prior to their final fixation may be used withoutdeparting from the scope of the present invention.

A fragmentary portion of a probe 207 of a third embodiment is shown inFIG. 16. Parts of the probe 207 corresponding to the probe 7 of thefirst embodiment are designated by the same reference numbers, plus“200”. Parts corresponding to those of the probe 107 of the secondembodiment will be given the same reference numeral, plus “100”. A probeshaft 219, tip 225 and separator 227 may be substantially similar to theprior embodiments. A flex circuit 231 can have a deformable substrate233 that is similar to the substrate 133 of the second embodiment shownin FIG. 11. However, a head 249 of the flex circuit substrate 233 wouldnot have the notches 148 because the head 249 is not held in place by anisolator 229 in the third embodiment.

Referring to FIGS. 14 and 15, the isolator 229 comprises a disk 208 anda skirt 212 that depends from the peripheral edge margin of the disk. Aslot 210 is formed in the disk 208 for receiving the head 249 throughthe isolator 229. A resilient locator 220 extends down from the disk208. When the isolator 220 is attached to the probe 207 it is deflectedin the same way as the locator 120 of the second embodiment and performsthe same function of locating a separator thermistor 237 and resistor239 (FIG. 16). A cavity 222 extending through the resilient locator 220permits the locator to deform for applying a spring force to thethermistor 237 and resistor 239. The top of the isolator disk 208 isformed with a flat or bridge 262 and receives the head 249 of the flexcircuit substrate 233 when it is bent over onto the isolator 229.

When the tip 225 is applied to the probe shaft 219, separator 227 andisolator 229, the tip engages a tip thermistor 235 and pushes the tipthermistor down. The bridge 262 (acting as a reaction surface) pushesupwardly to urge the tip thermistor 235 toward the tip 225 and ensuregood contact with the tip. Epoxy between the tip thermistor 235 and tip225 can be used as before to make the final fixation. As statedpreviously herein with respect to the second embodiment, the tipthermistor 235, separator thermistor 237 and resistor 239 could belocated on the inside of the flex circuit substrate 233 so that thesubstrate (and not the tip thermistor, separator thermistor or resistor)directly contacts the tip 225 and separator 227 (respectively).

When introducing elements of the present invention or the preferredembodiment(s) thereof, the articles “a”, “an”, “the” and “said” areintended to mean that there are one or more of the elements. The terms“comprising”, “including” and “having” are intended to be inclusive andmean that there may be additional elements other than the listedelements. Moreover, the use of “up”, “down”, “top” and “bottom” andvariations of these terms is made for convenience, but does not requireany particular orientation of the components.

As various changes could be made in the above without departing from thescope of the invention, it is intended that all matter contained in theabove description and shown in the accompanying drawings shall beinterpreted as illustrative and not in a limiting sense.

1. An electronic thermometer comprising: a probe tip adapted to beheated to a temperature by an object for use in measuring thetemperature of the object; a deformable circuit element including adeformable electrical conductor and at least one temperature sensorelectrically connected to the electrical conductor for detecting thetemperature of the probe tip; a probe shaft supporting the probe tip anddeformable circuit element and including an end portion; a locatingmember supported by the probe shaft formed for at least temporarilylocating the deformable circuit element.
 2. An electronic thermometer asset forth in claim 1 wherein the locating member has locating structureengaging the deformable circuit element to position the deformablecircuit element.
 3. An electronic thermometer as set forth in claim 2wherein said locating structure of the locating member comprises a nubprojecting outward from the locating member and engaging the deformablecircuit element.
 4. An electronic thermometer as set forth in claim 3wherein the deformable electrical conductor comprises a deformablesubstrate having an opening therein receiving the nub of the locatingmember.
 5. An electronic thermometer as set forth in claim 2 whereinsaid locating structure comprises a platform formed with the locatingmember, a portion of the deformable circuit element being held on theplatform.
 6. An electronic thermometer as set forth in claim 5 whereinthe platform is formed with at least one protrusion extending upwardfrom the platform, the protrusion capturing a portion of the deformableelectrical conductor of the deformable circuit element.
 7. An electronicthermometer as set forth in claim 6 wherein the deformable electricalconductor comprises a deformable substrate including at least one notch,the protrusion being received in the notch to hold the deformablesubstrate in position on the locating member.
 8. An electronicthermometer as set forth in claim 1 wherein the locating member includesa bridge located generally at an end of the probe shaft, the bridgeengaging a portion of the deformable circuit element.
 9. An electronicthermometer as set forth in claim 8 wherein the deformable circuitelement further comprises at least one other electrical deviceelectrically connected to the deformable electrical conductor, andwherein the locating member biases said other electrical device againstan interior wall of the separator.
 10. An electronic thermometer as setforth in claim 9 wherein the locating member includes a resilientlocator extending into the separator, the locator biasing said otherelectrical device against the interior wall of the separator.
 11. Anelectronic thermometer as set forth in claim 10 wherein the locatingmember includes a cavity located to permit resilient deformation by thelocator.
 12. An electronic thermometer as set forth in claim 1 whereinthe deformable circuit element further comprises at least one otherelectrical device electrically connected to the deformable electricalconductor, and wherein the locating member biases said other electricaldevice against an interior wall of the separator.
 13. An electronicthermometer as set forth in claim 1 wherein the locating membercomprises an isolator made of thermally insulating material.
 14. Anelectronic thermometer as set forth in claim 1 further comprising a baseunit and a cord connecting the probe shaft to the base unit.
 15. A probefor an electronic thermometer comprising: a probe tip adapted to beheated to the temperature by an object for use in measuring thetemperature of the object; a deformable circuit element including adeformable electrical conductor and at least one temperature sensorelectrically connected to the electrical conductor for detecting thetemperature of the probe tip; a probe shaft supporting the probe tip anddeformable circuit element and including an end portion; a separatorsupported by the probe shaft; a locating member supported by the probeshaft formed for at least temporarily locating the deformable circuitelement.
 16. A probe as set forth in claim 15 wherein the locatingmember has locating structure engaging the deformable circuit element toposition the deformable circuit element.
 17. A probe as set forth inclaim 16 wherein said locating structure of the locating membercomprises a nub projecting outward from the locating member and engagingthe deformable circuit element.
 18. A probe as set forth in claim 17wherein the deformable electrical conductor comprises a deformablesubstrate having an opening therein receiving the nub of the locatingmember.
 19. A probe as set forth in claim 16 wherein said locatingstructure comprises a platform formed with the locating member, aportion of the deformable circuit element being held on the platform.20. A probe as set forth in claim 19 wherein the platform is formed withat least one protrusion extending from the platform, the protrusioncapturing a portion of the deformable electrical conductor of thedeformable circuit element.
 21. An electronic thermometer as set forthin claim 19 wherein the deformable electrical conductor comprises adeformable substrate including at least one notch, the protrusion beingreceived in the notch to hold the deformable substrate in position onthe locating member.
 22. A probe as set forth in claim 15 wherein thelocating member includes a bridge located generally at an end of theprobe shaft, the bridge engaging a portion of the deformable circuitelement.
 23. A probe as set forth in claim 22 wherein the deformablecircuit element further comprises at least one other electrical deviceelectrically connected to the deformable electrical conductor, andwherein the locating member biases said other electrical device againstan interior wall of the separator.
 24. A probe as set forth in claim 23wherein the locating member includes a resilient locator extending intothe separator, the locator biasing said other electrical device againstthe interior wall of the separator.
 25. A probe as set forth in claim 24wherein the locating member includes a cavity located to permitresilient deformation by the locator.
 26. A probe as set forth in claim15 wherein the deformable circuit element further comprises at least oneother electrical device electrically connected to the deformableelectrical conductor, and wherein the locating member biases said otherelectrical device against an interior wall of the separator.
 27. Amethod of making a probe for an electronic thermometer comprising:positioning a deformable circuit element together with a probe shaft;deforming the deformable circuit element; connecting a separator to theprobe shaft; connecting a locating member to the probe shaft;interconnecting the deformable circuit element and locating member foruse in locating the deformable circuit element.
 28. A method as setforth in claim 27 wherein interconnecting the deformable circuit elementand locating member comprises inserting an opening in the deformablecircuit element onto a nub associated with the locating member.
 29. Amethod as set forth in claim 27 wherein interconnecting the deformablecircuit element and locating member comprises inserting a receivingportion of the locating member into notches formed on the deformablecircuit element.
 30. A method as set forth in claim 27 furthercomprising biasing with the locating member a portion of the deformablecircuit element against the separator.